High-temperature ferroelectric domain stability in epitaxial PbZr0.2Ti0.8O3 thin films
نویسندگان
چکیده
منابع مشابه
Domain wall roughness in epitaxial ferroelectric PbZr0.2Ti0.8O3 thin films.
The static configuration of ferroelectric domain walls was investigated using atomic force microscopy on epitaxial PbZr(0.2)Ti(0.8)O(3) thin films. Measurements of domain wall roughness reveal a power-law growth of the correlation function of relative displacements B(L) alpha L(2zeta) with zeta approximately 0.26 at short length scales L, followed by an apparent saturation at large L. In the sa...
متن کاملFerroelectric domain structures of epitaxial „001... BiFeO3 thin films
Ferroelectric domain structures of epitaxial BiFeO3 thin films on miscut 001 SrTiO3 substrates have been studied by transmission electron microscopy. BiFeO3 on 0.8° miscut substrates are composed of both 109° and 71° domains; in contrast, only 71° stripe domains are observed in BiFeO3 on 4° miscut 001 SrTiO3 substrates. The domain width in BiFeO3 on 4° miscut substrates increases as film thickn...
متن کاملFerroelectric domain morphologies of „001... PbZr1−xTixO3 epitaxial thin films
Ferroelectric domain morphologies in s001d PbZr1−xTixO3 epitaxial thin films were studied using the phase-field approach. The film is assumed to have a stress-free top surface and is subject to a biaxial substrate constraint. Both the electrostatic open-circuit and short-circuit boundary conditions on the film surfaces were considered. The phase-field simulations indicated that in addition to t...
متن کاملIn situ high-temperature x-ray diffraction study on domain evolution in ferroelectric (Pb,La)TiO 3 epitaxial thin films
متن کامل
Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films
Voltage-modulated scanning force microscopy ~Piezoresponse microscopy! is applied to investigate the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on ~001! SrTiO3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vec...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2006
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.2196482